DNA Damage Recognition
Wolfram Siede (Editor), Yoke Wah Kow (Editor), Paul W. Doetsch (Editor)
Stands as the most comprehensive guide to the subject—covering every essential topic related to DNA damage identification and repair. Covering a wide array of topics from bacteria to human cells, this book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. about the editors... WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany. YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts. PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.
年:
2005
版本:
1
出版商:
CRC Press
語言:
english
頁數:
896
ISBN 10:
0824759613
ISBN 13:
9780824759612
文件:
PDF, 15.49 MB
IPFS:
,
english, 2005